Moxtek has developed a high contrast IR polarizer on silicon suitable for long wavelength thermal IR applications using our aluminum nanowire, large area patterning capabilities. View document

Moxtek has developed several high contrast IR polarizers on silicon suitable for mid-wavelength and long-wavelength thermal IR applications using wafer-scale aluminum nanowire patterning capabilities. View document

The ProFlux® SIR Series Infrared polarizers, designed using Moxtek® Nanowire® Technology, provide excellent broadband infrared performance. Read more

Moxtek has invested many man-years of research into producing high performance polarizer options to complement many emerging technologies discussed in this paper. Read more

The XPIN-XT detector is a compact, low-cost Energy Dispersive X-Ray Florescence (EDXRF) detector. The XPIN-XT combines a silicon PIN diode, a Moxtek ultra-low-noise JFET, and a high performance two-stage thermoelectric cooler (TEC) achieving great resolution and x-ray sensitivity. View document

The XPIN-BT detector is a compact, low-cost Energy Dispersive X-Ray Florescence (EDXRF) detector. The XPIN-BT combines a silicon PIN diode, a Moxtek ultra-low-noise JFET, and a high performance two-stage thermoelectric cooler (TEC) achieving great resolution and x-ray sensitivity. View document

Visual Criteria Specification View document

Moxtek's® AP windows have established the standard for light element detection x-ray windows. Our AP windows have survived over 10,000 cycles at 1.2atm differential pressure. View document