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Wednesday, 5 February, 2014
Beryllium Material Safety Datasheet
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Wednesday, 5 February, 2014
ProFlux® ABS series absorptive polarizers are optimized to absorb unwanted RGB light bands, reducing stray light and thermal loading caused by back reflections common in LCD projection displays. These inorganic absorptive polarizers are precision manufactured in high volumes using Moxtek’s advanced NanoStack® technology and are ideal for many applications, including: high temperature projection displays, analytical systems, automotive, medical, research, and other applications. Our wire-grid polarizers are available in various sizes and shapes in both bare glass or in mounted forms.
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Thursday, 30 January, 2014
Moxtek has developed a high contrast IR polarizer on silicon suitable for long wavelength thermal IR applications using our aluminum nanowire, large area patterning capabilities. (more…)
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Thursday, 30 January, 2014
Moxtek has developed several high contrast IR polarizers on silicon suitable for mid-wavelength and long-wavelength thermal IR applications using wafer-scale aluminum nanowire patterning capabilities. (more…)
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Wednesday, 29 January, 2014
The ProFlux® SIR Series Infrared polarizers, designed using Moxtek® Nanowire® Technology, provide excellent broadband infrared performance. (more…)
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Wednesday, 22 January, 2014

Moxtek® has invested many man-years of research into producing high performance polarizer options to complement many emerging technologies discussed in this paper. (more…)

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Friday, 10 January, 2014
The XPIN®-XT detector is a compact, low-cost Energy Dispersive X-Ray Florescence (EDXRF) detector. The XPIN-XT combines a silicon PIN diode, a Moxtek ultra-low-noise JFET, and a high performance two-stage thermoelectric cooler (TEC) achieving great resolution and x-ray sensitivity. The XPIN preamp provides a low-noise signal output to an analog or digital pulse shaping amplifier. This detector does not require any external cooling. The XPIN-XT package is ideal for benchtop and portable applications where an integrated temperature controller is not required.
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Friday, 10 January, 2014
The XPIN®-BT detector is a compact, low-cost Energy Dispersive X-Ray Florescence (EDXRF) detector. The XPIN-BT combines a silicon PIN diode, a Moxtek ultra-low-noise JFET, and a high performance two-stage thermoelectric cooler (TEC) achieving great resolution and x-ray sensitivity. The XPIN preamp provides a low-noise signal output to an analog or digital pulse shaping amplifier. This detector does not require any external cooling. The XPIN-BT package is ideal for benchtop and portable applications requiring simple mounting, automatic temperature control, and metal preamp shielding.
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Thursday, 9 January, 2014
Visual Criteria (VC) summarized over 25mm diameter area of product or cut part. Large product sizes may not be available for all VC specifications.
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Thursday, 9 January, 2014
Moxtek’s® AP windows have established the standard for light element detection x-ray windows. Our AP windows have survived over 10,000 cycles at 1.2atm differential pressure. (more…)
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