ProFlux^® SIR Series Infrared polarizers provide excellent broadband infrared performance for applications in the 3-12μm wavelengths. These IR polarizers utilize Moxtek’s unique Nanowire^® Technology, specially engineered anti-reflective coatings, and high quality thin silicon substrates to achieve high transmission and contrast.   Click here to view the SIR datasheet

Moxtek^® DuraBeryllium^® windows are the highest performing beryllium x-ray windows available. DuraBeryllium windows have high x-ray transmission, are corrosion resistant, and vacuum tight. DuraBeryllium windows can be attached with a high temperature metal diffusion bond or using a vacuum compatible epoxy. DuraBeryllium windows are used in a variety of applications including microanalysis, EDXRF, WDXRF, and XRD. (more…)

Beryllium Material Safety Datasheet

ProFlux^® polarizers are designed using Moxtek^® Nanowire^® Technology to optimally control light and image polarization. These polarizers are compatible with high energy and high temperature environments.

Moxtek has developed a high contrast IR polarizer on silicon suitable for long wavelength thermal IR applications using our aluminum nanowire, large area patterning capabilities. (more…)

Moxtek has developed several high contrast IR polarizers on silicon suitable for mid-wavelength and long-wavelength thermal IR applications using wafer-scale aluminum nanowire patterning capabilities. (more…)

The ProFlux® SIR Series Infrared polarizers, designed using Moxtek® Nanowire® Technology, provide excellent broadband infrared performance. (more…)

Moxtek^® has invested many man-years of research into producing high performance polarizer options to complement many emerging technologies discussed in this paper. (more…)

The XPIN-XT detector is a compact, low-cost Energy Dispersive X-Ray Florescence (EDXRF) detector. The XPIN-XT combines a silicon PIN diode, a Moxtek ultra-low-noise JFET, and a high performance two-stage thermoelectric cooler (TEC) achieving great resolution and x-ray sensitivity. The XPIN preamp provides a low-noise signal output to an analog or digital pulse shaping amplifier. This detector does not require any external cooling. The XPIN-XT package is ideal for benchtop and portable applications where an integrated temperature controller is not required.

The XPIN-BT detector is a compact, low-cost Energy Dispersive X-Ray Florescence (EDXRF) detector. The XPIN-BT combines a silicon PIN diode, a Moxtek ultra-low-noise JFET, and a high performance two-stage thermoelectric cooler (TEC) achieving great resolution and x-ray sensitivity. The XPIN preamp provides a low-noise signal output to an analog or digital pulse shaping amplifier. This detector does not require any external cooling. The XPIN-BT package is ideal for benchtop and portable applications requiring simple mounting, automatic temperature control, and metal preamp shielding.