The XPIN detector is Moxtek’s best performing Si-PIN detector. XPIN detectors use a silicon PIN diode, multi-layer collimator, and thin DuraBeryllium window, achieving great resolution and x-ray sensitivity. View document
AP5 ultra-thin polymer windows are the highest performing x-ray windows available for low and high energy x-ray analysis. AP5 windows are ideal for applications that require maximum View document
Ultra Broadband polarizer’s are designed to offer an excellent solution for almost any multi-wavelength application. The wide-band characteristics of this polarizer, enables a wide range of products and technologies. View document
ProLINE™ Series windows are ideal for applications that require high transmission of low energy x-rays. ProLINE Series windows have higher performance than stretched polypropylene and other commonly used WDXRF windows. View document
Pixelated polarizers are designed using Moxtek® Nanowire® Technology. Pixelated polarizers are available as two, three and four-state devices for polarimetric imaging. View document
ProFlux® Beamsplitter Nanowire® Technology is optimized to operate at 45°, providing durable polarizing beamsplitters. These beamsplitters can be used for a variety of both imaging and non-imaging applications for display products and scientific instruments. View document
ProFlux® SIR Series Infrared polarizers provide excellent broadband infrared performance for applications in the 3-12μm wavelengths. These IR polarizers utilize Moxtek’s unique Nanowire® Technology, specially engineered anti-reflective coatings, and high quality thin silicon substrates to achieve high transmission and contrast. Click here to view the SIR datasheet View document
