Manufacture of X-ray tubes requires state-of-the-art characterization techniques. For many years photographic film has been the traditional technique for the characterization of the electron-beam spot size and location, as well as for taking X-ray images. View document

This presentation compares noise, resolution, and peaking time. View document

The XPINXT package is ideal for benchtop and portable applications where an integrated temperature controller is not required. View document

The XPIN detector is Moxtek’s best performing Si-PIN detector. XPIN detectors use a silicon PIN diode, multi-layer collimator, and thin DuraBeryllium window, achieving great resolution and x-ray sensitivity. View document

AP5 ultra-thin polymer windows are the highest performing x-ray windows available for low and high energy x-ray analysis. AP5 windows are ideal for applications that require maximum View document

Ultra Broadband polarizer’s are designed to offer an excellent solution for almost any multi-wavelength application. The wide-band characteristics of this polarizer, enables a wide range of products and technologies. View document

ProLINE™ Series windows are ideal for applications that require high transmission of low energy x-rays. ProLINE Series windows have higher performance than stretched polypropylene and other commonly used WDXRF windows. View document

Moxtek's visible polarizers are heat tolerant, accept wide angles of incidence, and have high transmission and contrast. View document

Pixelated polarizers are designed using Moxtek® Nanowire® Technology. Pixelated polarizers are available as two, three and four-state devices for polarimetric imaging. View document

ProFlux® Beamsplitter Nanowire® Technology is optimized to operate at 45°, providing durable polarizing beamsplitters. These beamsplitters can be used for a variety of both imaging and non-imaging applications for display products and scientific instruments. View document