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XPIN-XT Detector in Angle Bracket
XPIN-BT Dectector
MXDPP-50 End-User Ready Version, (L 185mm x W 146mm x H 43mm)
MXDPP-50 OEM Version, (L 169mm x W 71mm x H 29mm)

XPIN-XT Detector in Angle Bracket

XPIN-BT Dectector

MXDPP-50 End-User Ready Version, (L 185mm x W 146mm x H 43mm)

MXDPP-50 OEM Version, (L 169mm x W 71mm x H 29mm)

Our Si-PIN x-ray detectors are used for a variety of demanding energy dispersive x-ray fluorescence (EDXRF) industrial and scientific applications. XPIN® detectors are optimized to provide maximum resolution, count rate, energy absorption, and peak-to-background. Our XPIN detectors are ideal for benchtop and hand-held energy dispersive x-ray fluorescence (EDXRF) instrumentation.

Our MXDPP-50 digital pulse processor (DPP) is ideal for analytical x-ray and gamma-ray instruments such as; Silicon Drift Detector, Si-PIN, CaTe, Si(Li), and Ge detectors. The MXDPP-50 is designed to digitize detector output signals, achieving high throughput, with excellent pile-up rejection. The MXDPP-50 OEM card version is configured for simple attachment to benchtop and portable applications. Our OEM version includes the digital pulse processor, the detector power supply including high voltage bias, and the automatic temperature controller for Moxtek detectors.

Configurable Parameters

  • Active area
  • XPIN Configuration style (BT or XT)
  • XT mounting options (AB or HS)
  • XPIN BT adapter plate
  • Thin (8µm) window options
  • Optional cables

Benefits

  • High throughput
  • Good pile-up rejection
  • High peak to background
  • Low power consumption
  • Easy to integrate
  • Reliability in the field

Validations

  • Microscopy and Microanalysis member

  • SPIE member

  • American Vacuum Society member

  • ICDD member

  • IEEE Society member

  • High Vacuum and Thin Films

  • ISO 9001

  • Institutional Member of EXSA (x-ray)