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Energy Dispersive Spectroscopy (EDS) instrument manufacturers and research labs are continually pressing for x-ray components that enable higher performance at a lower cost. High performing x-ray detectors are critical to building quality instruments. Moxtek® has improved the sensitivity of our Si-PIN detectors by using thicker diodes and thinner beryllium windows. The increased performance enables faster […] Read more »

This preliminary setup will lead to a prototype simultaneous XRD/XRF instrument. View document »

A first prototype XRD/XRF instrument was developed at NASA Ames Research Center and is currently in use at Los Alamos National Laboratory. The intended applications for this instrument are for planetary exploration and as a portable instrument for terrestrial use. View document »

The MX-40 has a very small gate capacitance (0.26 pF). This is accomplished by making the diameter (“width”) of the gate very small. View document »

To gain a better understanding and measure of miniature x-ray sources so that performance can be optimized in your application. View document »

The electron field-emission properties of carbon nanotubes enable the fabrication of cold cathodes for a variety of vacuum device applications. The utilization of these cathodes is an attractive alternative for the replacement of thermionic or hot cathodes for generating X-rays. View document »

With the miniaturization of XRF instrumentation, there has been a need for a compact, portable, battery-powered X-ray tube. In 2001 MOXTEK introduced a miniature X-ray tube designed to address the needs of handheld XRF analyzers. View document »

For a number of years the Cornell High Energy Synchrotron Source (CHESS) has been fabricating and using single-bounce monocapillary optics to produce x-ray microbeams. With our current technology, these optics have achieved beam sizes of 5 to 50 of 2 to 10 mrad, and gains of 10 to 1000. View document »

Moxtek now has a full energy dispersive detector solution with Moxtek’s MXDPP-50. We will present characterization details of the DPP with Moxtek’s XPIN® detectors, including resolution verses peaking time, resolution and peak channel verses the input count rate, and other characterization details. View document »

Manufacture of X-ray tubes requires state-of-the-art characterization techniques. For many years photographic film has been the traditional technique for the characterization of the electron-beam spot size and location, as well as for taking X-ray images. View document »